onsemi — Hyperlux ID Family iToF Sensors

onsemi has launched the Hyperlux™ ID family of real-time, indirect time-of-flight (iToF) sensors which offer the real-time performance required to enable 3D imaging of fast-moving objects. The AF0130 and AF0131 iToF sensors can also be used to make precise distance measurements over a long range.  

By introducing this new generation of high-performance iToF ranging sensors, onsemi is enabling substantial improvements to productivity and safety of robots and automated mobile equipment in complex environments.  

Benefiting from a new global-shutter pixel architecture developed by onsemi, alongside on-board storage, the Hyperlux ID family sensors can capture an entire scene and simultaneously process depth measurements in real time. This innovative approach overcomes the limitations of standard iToF sensors and enables depth sensing at up to 30 m, some four times further than competing iToF sensors.  

In addition, the AF013x sensors produce both monochrome images and depth information at the same time. By combining these two outputs, the sensor can provide a comprehensive view of the environment without requiring separate sensors for visual and depth data. 

In industrial environments, use of the AF013x sensors enables object detection for better navigation and collision avoidance in automation and robotics equipment, improving safety on the factory floor. In manufacturing and quality control, these sensors can measure the volume and shape of objects and detect defects. 

In logistics and materials handling applications, the iToF sensors can measure the positions, sizes and content ratios of pallets and cargo to help optimize storage and transportation processes. In agriculture and farming, the sensors may be used to monitor crop growth and health, while in access control, detailed and accurate facial recognition can be performed. 

The iToF technology in the AF013x senses depth by measuring the phase shift of the reflected light emitted from vertical-cavity surface-emitting lasers (VCSELs). The proprietary onsemi pixel architecture enables the sensors to capture and store four different phases of light simultaneously in one exposure, instantly capturing the entire scene and enhancing depth measurement accuracy.  

Additionally, the global shutter technology aligns all sensor pixels with the VCSEL to significantly reduce ambient infrared noise from other lighting sources.  

The AF0130 includes an integrated depth processing engine, which calculates depth, confidence and intensity maps at high speed. This eliminates the need for costly external memory and a high-performance processor.  

The AF0131 has no on-chip depth processing, making it suitable for manufacturers which prefer to perform depth calculations off-chip.